منابع مشابه
Phase-targeted X-ray diffraction
A powder X-ray diffraction (XRD) method to enhance the signal of a specific crystalline phase within a mixture is presented for the first time. Specificity to the targeted phase relies on finding coincidences in the ratios of crystal d spacings and the ratios of elemental characteristic X-ray energies. Such coincidences can be exploited so that the two crystal planes diffract through the same s...
متن کاملX-ray diffraction.
where the peak shapes were described by a pseudo-Voigt function and the background was modeled with an 6-term polynomial. Additionally, the PXRD patterns obtained at room temperature and 100 K were analyzed by Le Bail refinement using the GSAS and EXPGUI software, 2,3 where the peak shapes were described by a pseudo-Voigt function (CW profile function 3) and the background was modeled with an 4...
متن کاملHigh-throughput synchrotron X-ray diffraction for combinatorial phase mapping.
Discovery of new materials drives the deployment of new technologies. Complex technological requirements demand precisely tailored material functionalities, and materials scientists are driven to search for these new materials in compositionally complex and often non-equilibrium spaces containing three, four or more elements. The phase behavior of these high-order composition spaces is mostly u...
متن کاملSolving the Phase Problem Using Reference-Beam X-Ray Diffraction
A new method of obtaining Bragg reflection phases in an x-ray diffraction experiment is presented. It combines the phase-sensitive principles of multiple-beam diffraction and x-ray standing waves, and allows direct phase measurements of many multiple reflections simultaneously using a Bragg-inclined oscillating-crystal geometry. A modified-two-beam intensity function is devised to extract the p...
متن کاملTriplet-phase measurements using reference-beam X-ray diffraction.
Reference-beam diffraction (RBD) is a recently developed phase-sensitive X-ray diffraction technique that incorporates the principle of multiple-beam diffraction into the standard oscillating-crystal data-collection method [Shen (1998). Phys. Rev. Lett. 80, 3268-3271]. Using this technique, a large number of multiple-beam interference profiles can be recorded simultaneously on an area detector,...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Applied Crystallography
سال: 2016
ISSN: 1600-5767
DOI: 10.1107/s1600576716011936